Publicación: Speckle interferometry single-shot applications with multiple carrier-fringe information
| datacite.rights | http://purl.org/coar/access_right/c_14cb | spa |
| dc.audience | Público general | spa |
| dc.contributor.author | Sánchez Barrera, Estiven | |
| dc.date.accessioned | 2023-07-27T20:24:53Z | |
| dc.date.available | 2023-07-27T20:24:53Z | |
| dc.date.issued | 2023-06-15 | |
| dc.date.submitted | 2023-06-15 | |
| dc.description.abstract | The need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle. | spa |
| dc.format.extent | 11 páginas | |
| dc.format.mimetype | application/pdf | spa |
| dc.identifier.citation | Estiven Sánchez Barrera, "Speckle interferometry single-shot applications with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252402 (15 June 2023); doi: 10.1117/12.2662369 | spa |
| dc.identifier.instname | Universidad Tecnológica de Bolívar | spa |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.reponame | Repositorio Universidad Tecnológica de Bolívar | spa |
| dc.identifier.uri | https://hdl.handle.net/20.500.12585/12442 | |
| dc.language.iso | eng | spa |
| dc.publisher.place | Cartagena de Indias | spa |
| dc.rights.accessrights | info:eu-repo/semantics/closedAccess | spa |
| dc.subject.keywords | Digital Speckle Pattern Interferometry | spa |
| dc.subject.keywords | Spatial Phase Measurement | spa |
| dc.subject.keywords | Robust Measurement | spa |
| dc.subject.keywords | Carrier-fringes | spa |
| dc.subject.keywords | Single-shot applications | spa |
| dc.title | Speckle interferometry single-shot applications with multiple carrier-fringe information | spa |
| dc.type | Documento de Conferencia | spa |
| dc.type.coar | http://purl.org/coar/resource_type/c_8544 | spa |
| dc.type.driver | info:eu-repo/semantics/lecture | spa |
| dc.type.hasversion | info:eu-repo/semantics/publishedVersion | spa |
| dcterms.bibliographicCitation | Goodman, J. W., [Speckle phenomena in optics: theory and applications ], SPIE (2007). | spa |
| dcterms.bibliographicCitation | (ed), P. K. R., “Digital speckle pattern interferometry and related techniques,” Measurement Science and Technology 12, 1606 (sep 2001). | spa |
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| dcterms.bibliographicCitation | Pedrini, G., Zou, Y.-L., and Tiziani, H. J., “Quantitative evaluation of digital shearing interferogram using the spatial carrier method,” Pure and Applied Optics: Journal of the European Optical Society Part A 5, 313 (may 1996). | spa |
| dcterms.bibliographicCitation | Santos, F., Vaz, M., and Monteiro, J., “A new set-up for pulsed digital shearography applied to defect detection in composite structures,” Optics and Lasers in Engineering 42(2), 131–140 (2004). | spa |
| dcterms.bibliographicCitation | Bhaduri, B., Mohan, N. K., Kothiyal, M. P., and Sirohi, R., “Use of spatial phase shifting technique in digital speckle pattern interferometry (dspi) and digital shearography (ds),” Opt. Express 14, 11598–11607 (Nov 2006). | spa |
| dcterms.bibliographicCitation | Barrera, E. S., Fantin, A. V., Willemann, D. P., Benedet, M. E., and Albertazzi Gon¸calves Jr., A., “Multiple aperture one-shot shearography for simultaneous measurements in three shearing directions,” Optics and Lasers in Engineering 111, 86–92 (2018). | spa |
| dcterms.bibliographicCitation | Takeda, M., Ina, H., and Kobayashi, S., “Fourier-transform method of fringe-pattern analysis for computer based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (Jan 1982). | spa |
| dcterms.bibliographicCitation | Chang, G.-W., Lin, Y.-H., and Yeh, Z.-M., “White light interferometric profile measurement system us ing spectral coherence,” in [Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI], Hartzell, A. L. and Ramesham, R., eds., 6463, 64630I, International Society for Optics and Photonics, SPIE (2007). | spa |
| dcterms.bibliographicCitation | Barrera, E. S. and Cuello, J. L. E., “Measuring material thickness changes through tri-aperture digital speckle pattern interferometry,” Optical Engineering 62(1), 014108 (2023). | spa |
| dspace.entity.type | Publication | |
| oaire.resourcetype | http://purl.org/coar/resource_type/c_c94f | spa |
| oaire.version | http://purl.org/coar/version/c_970fb48d4fbd8a85 | spa |
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