Publicación: Speckle interferometry single-shot applications with multiple carrier-fringe information
Portada
Cargando...
Citas bibliográficas
Código QR
Métricas
Autores
Autor corporativo
Recolector de datos
Otros/Desconocido
Director audiovisual
Editor
Tipo de Material
Fecha
Citación
Estiven Sánchez Barrera, "Speckle interferometry single-shot applications
with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional
Optical Metrology and Inspection for Practical Applications XII
, 1252402 (15 June 2023); doi: 10.1117/12.2662369
Título de serie/ reporte/ volumen/ colección
Es Parte de
Resumen en español
The need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle.
Descripción
Notas
Es basado en (relación)
Es la base de (relación)
URL del Recurso
Identificador ISBN
Identificador ISSN
0277-786X
PDF
FLIP 
