Power Shunt Capacitor Bank Management Model Based on Life Expectancy and Risk Overtime

dc.contributor.authorTrujillo, Camiloeng
dc.date.accessioned2022-03-23 00:00:00
dc.date.accessioned2025-05-21T19:15:44Z
dc.date.available2022-03-23 00:00:00
dc.date.issued2022-03-23
dc.description.abstractIn this paper is presented a model to assess shunt power capacitor banks. The model seeks to support decision making by optimizing incomes and considering risk. Hence, to model incomes the revenue, maintenance cost, electrical losses, dismantling cost and risk are considered. The risk is monetized as a critical cost times probability of failure. Probability of failure is estimated using shunt bank degradation. To assess the model, the data of an operating shunt bank was used and the Colombian regulation was assumed for financial values. As a result, different maintenance strategies was evaluated in order to know the optimum one.eng
dc.format.mimetypeapplication/pdfeng
dc.identifier.doi10.32397/tesea.vol3.n1.1
dc.identifier.eissn2745-0120
dc.identifier.urihttps://hdl.handle.net/20.500.12585/13499
dc.identifier.urlhttps://doi.org/10.32397/tesea.vol3.n1.1
dc.language.isoengeng
dc.publisherUniversidad Tecnológica de Bolívareng
dc.relation.bitstreamhttps://revistas.utb.edu.co/tesea/article/download/462/361
dc.relation.citationeditionNúm. 1 , Año 2022 : Transactions on Energy Systems and Engineering Applicationseng
dc.relation.citationendpage6
dc.relation.citationissue1eng
dc.relation.citationstartpage1
dc.relation.citationvolume3eng
dc.relation.ispartofjournalTransactions on Energy Systems and Engineering Applicationseng
dc.relation.referencesG. C. Montanari, I. Ghinello, and D. Fabiani, “Accelerated degradation of capacitor PP films under voltage distortion,” in 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.98CH36257), pp. 686–689, doi: 10.1109/CEIDP.1998.732990. [2] G. C. Montanari and D. Fabiani, “Searching for the factors which affect self-healing capacitor degradation under non-sinusoidal voltage,” IEEE Trans. Dielectr. Electr. Insul., vol. 6, no. 3, pp. 319–325, Jun. 1999, doi: 10.1109/94.775617. [3] H. N. Nagamani and S. Ganga, “A study of electrical endurance of MPPF capacitors and selection of end-point criteria,” IEEE Trans. Electr. Insul., vol. 27, no. 6, pp. 1193–1201, 1992, doi: 10.1109/14.204871. [4] IEEE Std 1036 TM-2010 1036 IEEE Guide for the Application of Shunt Power Capacitors.. 2010. [5] ISO 55001:2014, Asset management — Management systems — Requirements. 2014. [6] Li En-Wen and Song Bin, “Transformer health status evaluation model based on multi-feature factors,” in International Conference on Power System Technology, Oct. 2014, no. Powercon, pp. 1417–1422, doi: 10.1109/POWERCON.2014.6993723. [7] R. E. Brown, G. Frimpong, and H. L. Willis, “Failure rate modeling using equipment inspection data,” IEEE Trans. Power Syst., vol. 19, no. 2, pp. 782–787, 2004, doi: 10.1109/TPWRS.2004.825824. [8] Comisi´on de Regulaci´on de Energ´ıa y Gas, Resoluci´on No. 015 de 2018: Por la cual se establece la metodolog´ıa para la remuneraci´on de la actividad de distribuci´on de energ´ıa el´ectrica en el Sistema Interconectado Nacional, January 29-2018. [9] L. A. Cardenas, D. L. Alvarez, S. Rodolfo Garcia, and F. A. Herrera, “Overhead Lines Assessment using Health Index,” FISE-IEEE/CIGRE Conf. - Living Energy Transition, FISE/CIGRE 2019, pp. 3–8, 2019, doi: 10.1109/FISECIGRE48012.2019.8984959. [10] M. Dong et al., “A novel maintenance decision making model of power transformers based on reliability and economy assessment,” IEEE Access, vol. 7, pp. 28778–28790, 2019, doi: 10.1109/ACCESS.2019.2897606. [11] Enel-Codensa, Internal reports of the utility. [12] R. Gallay, Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis, Published by CERN in the Proceedings of the CAS-CERN Accelerator School: Power Converters, Baden, Switzerland, 7–14 May 2014, edited by R. Bailey, CERN-2015-003 (CERN, Geneva, 2015). doi: 10.5170/CERN-2015-003.45. [13] B. S. DHILLON, “Topics in Reliability,” Eng. Maintainab., pp. 224–249, 1999, doi: 10.1016/b978-088415257-6/50012-0.eng
dc.rightsCamilo Trujillo - 2022eng
dc.rights.accessrightsinfo:eu-repo/semantics/openAccesseng
dc.rights.coarhttp://purl.org/coar/access_right/c_abf2eng
dc.rights.creativecommonsThis work is licensed under a Creative Commons Attribution 4.0 International License.eng
dc.rights.urihttp://creativecommons.org/licenses/by/4.0eng
dc.sourcehttps://revistas.utb.edu.co/tesea/article/view/462eng
dc.subjectAsset Managementeng
dc.subjectHealth Index (HI)eng
dc.subjectShunt Banks (SB)eng
dc.subjectRiskeng
dc.titlePower Shunt Capacitor Bank Management Model Based on Life Expectancy and Risk Overtimespa
dc.title.translatedPower Shunt Capacitor Bank Management Model Based on Life Expectancy and Risk Overtimespa
dc.typeArtículo de revistaspa
dc.type.coarhttp://purl.org/coar/resource_type/c_6501eng
dc.type.coarversionhttp://purl.org/coar/version/c_970fb48d4fbd8a85eng
dc.type.contentTexteng
dc.type.driverinfo:eu-repo/semantics/articleeng
dc.type.localJournal articleeng
dc.type.versioninfo:eu-repo/semantics/publishedVersioneng

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