Microscopic shape from focus using white light interferometric fringes

datacite.rightshttp://purl.org/coar/access_right/c_16ec
dc.creatorAltamar Mercado, Hernando
dc.creatorPatiño Vanegas, Alberto
dc.creatorMarrugo A.G.
dc.date.accessioned2020-03-26T16:32:35Z
dc.date.available2020-03-26T16:32:35Z
dc.date.issued2018
dc.description.abstractIn this work we study the use of a focus measure to improve the 3D reconstruction of low reflectivity microscopic samples using white light interference microscopy. Simulation and experimental results show the improved reconstruction. © 2018 The Author(s).eng
dc.format.mediumRecurso electrónico
dc.format.mimetypeapplication/pdf
dc.identifier.citationOptics InfoBase Conference Papers; Vol. Part F95-3D 2018
dc.identifier.doi10.1364/3D.2018.JTu4A.19
dc.identifier.instnameUniversidad Tecnológica de Bolívar
dc.identifier.isbn9781557528209
dc.identifier.orcid57203321995
dc.identifier.orcid57190688459
dc.identifier.orcid24329839300
dc.identifier.reponameRepositorio UTB
dc.identifier.urihttps://hdl.handle.net/20.500.12585/8903
dc.language.isoeng
dc.publisherOSA - The Optical Society
dc.relation.conferencedate25 June 2018 through 28 June 2018
dc.rights.accessrightsinfo:eu-repo/semantics/restrictedAccess
dc.rights.ccAtribución-NoComercial 4.0 Internacional
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.sourcehttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85051263259&doi=10.1364%2f3D.2018.JTu4A.19&partnerID=40&md5=4a022a8af3e8ac7c0cdb439cddfa34e4
dc.source.event3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2018
dc.subject.keywordsImage acquisition
dc.subject.keywords3D reconstruction
dc.subject.keywordsFocus measure
dc.subject.keywordsInterferometric fringes
dc.subject.keywordsShape from focus
dc.subject.keywordsWhite light
dc.subject.keywordsWhite light interference microscopy
dc.subject.keywordsThree dimensional displays
dc.titleMicroscopic shape from focus using white light interferometric fringes
dc.type.driverinfo:eu-repo/semantics/conferenceObject
dc.type.hasversioninfo:eu-repo/semantics/publishedVersion
dc.type.spaConferencia
dcterms.bibliographicCitationEndo, T., Yasuno, Y., Makita, S., Itoh, M., Yatagai, T., 'Profilometry with line-field Fourier-domain interferometry.' (2005) Optics express, 13, pp. 695-701
dcterms.bibliographicCitationLizˇewski, K., Tomczewski, S., Kozacki, T., Kostencka, J., 'High-precision topography measurement through accurate in-focus plane detection with hybrid digital holographic microscope and white light interferometer module.' (2014) Applied optics, 53, pp. 2446-2454
dcterms.bibliographicCitationPech-Pacheco, J., Cristobal, G., Chamorro-Martinez, J., Fernandez-Valdivia, J., 'Diatom autofocusing in brightfield microscopy: a comparative study' (2000) Proceedings 15th International Conference on Pattern Recognition. ICPR-2000, 3, pp. 314-317
dcterms.bibliographicCitationPertuz, S., Puig, D., Garcia, M.A., 'Analysis of focus measure operators for shape-from-focus,' (2013) Pattern Recognition, 46, pp. 1415-1432
oaire.resourceTypehttp://purl.org/coar/resource_type/c_c94f
oaire.versionhttp://purl.org/coar/version/c_970fb48d4fbd8a85

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