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Extended focused image in white light scanning interference microscopy
| dc.contributor.author | Altamar-Mercado, Hernando | |
| dc.contributor.author | Patiño-Vanegas, Alberto | |
| dc.contributor.author | Marrugo, Andrés G. | |
| dc.date.accessioned | 2023-07-19T21:26:04Z | |
| dc.date.available | 2023-07-19T21:26:04Z | |
| dc.date.issued | 2019 | |
| dc.date.submitted | 2023 | |
| dc.identifier.citation | Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group. | spa |
| dc.identifier.uri | https://hdl.handle.net/20.500.12585/12241 | |
| dc.description.abstract | We propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s). | spa |
| dc.format.mimetype | application/pdf | spa |
| dc.language.iso | eng | spa |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
| dc.source | Optics InfoBase Conference Papers | spa |
| dc.title | Extended focused image in white light scanning interference microscopy | spa |
| dcterms.bibliographicCitation | Altamar-Mercado, H., Patiño-Vanegas, A., Marrugo, A.G. Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy (2019) Applied Optics, 58 (5), pp. A101-A111. Cited 10 times. https://www.osapublishing.org/ao/abstract.cfm?uri=ao-58-5-A101 doi: 10.1364/AO.58.00A101 | spa |
| dcterms.bibliographicCitation | Altamar-Mercado, H., Patiño-Vanegas, A., Marrugo, A.G. Adaptive filtering of interference fringes by polar transformation and empirical mode decomposition (2018) Optics InfoBase Conference Papers, Part F123-LAOP 2018. ISBN: 978-194358049-1 doi: 10.1364/LAOP.2018.W4C.4 | spa |
| dcterms.bibliographicCitation | Wang, Z., Bovik, A.C. A universal image quality index (Open Access) (2002) IEEE Signal Processing Letters, 9 (3), pp. 81-84. Cited 4592 times. doi: 10.1109/97.995823 | spa |
| datacite.rights | http://purl.org/coar/access_right/c_abf2 | spa |
| oaire.version | http://purl.org/coar/version/c_b1a7d7d4d402bcce | spa |
| dc.type.driver | info:eu-repo/semantics/article | spa |
| dc.type.hasversion | info:eu-repo/semantics/draft | spa |
| dc.identifier.doi | Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group. | |
| dc.subject.keywords | Interferometry; | spa |
| dc.subject.keywords | Interference Microscopy; | spa |
| dc.subject.keywords | Surface Topography | spa |
| dc.rights.accessrights | info:eu-repo/semantics/openAccess | spa |
| dc.rights.cc | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
| dc.identifier.instname | Universidad Tecnológica de Bolívar | spa |
| dc.identifier.reponame | Repositorio Universidad Tecnológica de Bolívar | spa |
| dc.publisher.place | Cartagena de Indias | spa |
| dc.subject.armarc | LEMB | |
| dc.type.spa | http://purl.org/coar/resource_type/c_6501 | spa |
| oaire.resourcetype | http://purl.org/coar/resource_type/c_6501 | spa |
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http://creativecommons.org/licenses/by-nc-nd/4.0/
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