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Measuring material thickness variations through tri-aperture DSPI

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datacite.rightshttp://purl.org/coar/access_right/c_16ecspa
dc.audiencePúblico generalspa
dc.contributor.authorSánchez Barrera, Estiven
dc.contributor.authorEalo Cuello, Joao Luis
dc.date.accessioned2023-06-30T18:43:43Z
dc.date.available2023-06-30T18:43:43Z
dc.date.issued2023-06-15
dc.date.submitted2023-06-30
dc.description.abstractA configuration for the measurement of thickness changes in materials through one-shot digital speckle pattern interferometry (DSPI) was developed. The phase maps calculation was made by adding carrier fringes by the multiple aperture principle and Fourier Transform Method (FTM). With this setup, interferometry configurations verified that the simultaneous and instantaneous visualization of two opposite faces of a surface is possible. In addition, the combination of the simultaneous results obtained from both sides of the material makes it possible to determine displacements with greater sensitivity or to identify changes in their thickness. The validation and demonstrative tests were carried out with a 1-mm thick aluminum plate with a 5-mm diameter through hole coated. Thickness changes until 2 μm was measured.spa
dc.description.sponsorshipUniversidad Tecnológica de Bolívarspa
dc.format.extent9
dc.format.mimetypeapplication/pdfspa
dc.identifier.citationEstiven Sánchez Barrera and Joao Luis Ealo Cuello "Measuring material thickness variations through tri-aperture DSPI", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 125240C (15 June 2023); https://doi.org/10.1117/12.2663667spa
dc.identifier.doi10.1117/12.2663667
dc.identifier.instnameUniversidad Tecnológica de Bolívarspa
dc.identifier.reponameRepositorio Universidad Tecnológica de Bolívarspa
dc.identifier.urihttps://hdl.handle.net/20.500.12585/12091
dc.language.isoengspa
dc.publisher.placeCartagena de Indiasspa
dc.publisher.sedeCampus Tecnológicospa
dc.rights.accessrightsinfo:eu-repo/semantics/restrictedAccessspa
dc.sourceProceedings of SPIE, the International Society for Optical Engineering.spa
dc.subject.armarcLEMB
dc.subject.keywordsDSPIspa
dc.subject.keywordsCarrier Fringesspa
dc.subject.keywordsFourier Transform Methodspa
dc.subject.keywordsMultiple Aperturespa
dc.subject.keywordsThickness Variations.spa
dc.titleMeasuring material thickness variations through tri-aperture DSPIspa
dc.typeArtículo de revistaspa
dc.type.coarhttp://purl.org/coar/resource_type/c_2df8fbb1spa
dc.type.driverinfo:eu-repo/semantics/articlespa
dc.type.hasversioninfo:eu-repo/semantics/publishedVersionspa
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