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Extended focused image in white light scanning interference microscopy

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datacite.rightshttp://purl.org/coar/access_right/c_abf2spa
dc.contributor.authorMarrugo Hernández, Andrés Guillermo
dc.contributor.authorAltamar Mercado, Hernando Rafael
dc.contributor.authorPatiño Vanegas, Alberto
dc.date.accessioned2023-07-19T21:26:04Z
dc.date.available2023-07-19T21:26:04Z
dc.date.issued2019
dc.date.submitted2023
dc.description.abstractWe propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s).spa
dc.format.mimetypeapplication/pdfspa
dc.identifier.citationAltamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.spa
dc.identifier.doiAltamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.
dc.identifier.instnameUniversidad Tecnológica de Bolívarspa
dc.identifier.reponameRepositorio Universidad Tecnológica de Bolívarspa
dc.identifier.urihttps://hdl.handle.net/20.500.12585/12241
dc.language.isoengspa
dc.publisher.placeCartagena de Indiasspa
dc.rights.accessrightsinfo:eu-repo/semantics/openAccessspa
dc.rights.ccAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.sourceOptics InfoBase Conference Papersspa
dc.subject.armarcLEMB
dc.subject.keywordsInterferometry;spa
dc.subject.keywordsInterference Microscopy;spa
dc.subject.keywordsSurface Topographyspa
dc.titleExtended focused image in white light scanning interference microscopyspa
dc.typeArtículo de revistaspa
dc.type.coarhttp://purl.org/coar/resource_type/c_6501spa
dc.type.driverinfo:eu-repo/semantics/articlespa
dc.type.hasversioninfo:eu-repo/semantics/draftspa
dcterms.bibliographicCitationAltamar-Mercado, H., Patiño-Vanegas, A., Marrugo, A.G. Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy (2019) Applied Optics, 58 (5), pp. A101-A111. Cited 10 times. https://www.osapublishing.org/ao/abstract.cfm?uri=ao-58-5-A101 doi: 10.1364/AO.58.00A101spa
dcterms.bibliographicCitationAltamar-Mercado, H., Patiño-Vanegas, A., Marrugo, A.G. Adaptive filtering of interference fringes by polar transformation and empirical mode decomposition (2018) Optics InfoBase Conference Papers, Part F123-LAOP 2018. ISBN: 978-194358049-1 doi: 10.1364/LAOP.2018.W4C.4spa
dcterms.bibliographicCitationWang, Z., Bovik, A.C. A universal image quality index (Open Access) (2002) IEEE Signal Processing Letters, 9 (3), pp. 81-84. Cited 4592 times. doi: 10.1109/97.995823spa
dspace.entity.typePublication
oaire.resourcetypehttp://purl.org/coar/resource_type/c_6501spa
oaire.versionhttp://purl.org/coar/version/c_b1a7d7d4d402bccespa
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relation.isAuthorOfPublication276cfc78-a984-49e2-a962-a3ed47c35f62
relation.isAuthorOfPublication.latestForDiscovery651b0410-2e8f-4894-87bc-d3d803c92eab

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