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LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation

dc.creatorAcevedo Patiño, Óscar
dc.creatorKagaris D.
dc.date.accessioned2020-03-26T16:32:37Z
dc.date.available2020-03-26T16:32:37Z
dc.date.issued2017
dc.identifier.citationLATS 2017 - 18th IEEE Latin-American Test Symposium
dc.identifier.isbn9781538604151
dc.identifier.urihttps://hdl.handle.net/20.500.12585/8936
dc.description.abstractIn built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this paper, we present a method to design the LFSR/PS structure based on the particular test set that we are given. Comparative experimental results show that the methodology can attain 100% coverage which cannot be achieved with current approaches. © 2017 IEEE.eng
dc.description.sponsorshipIEEE Colombia Chapter
dc.format.mediumRecurso electrónico
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.sourcehttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85020214634&doi=10.1109%2fLATW.2017.7906758&partnerID=40&md5=786fd8d8ebbd541ded723bc37ccb1a54
dc.sourceScopus2-s2.0-85020214634
dc.titleLFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation
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datacite.rightshttp://purl.org/coar/access_right/c_16ec
oaire.resourceTypehttp://purl.org/coar/resource_type/c_c94f
oaire.versionhttp://purl.org/coar/version/c_970fb48d4fbd8a85
dc.source.event18th IEEE Latin-American Test Symposium, LATS 2017
dc.type.driverinfo:eu-repo/semantics/conferenceObject
dc.type.hasversioninfo:eu-repo/semantics/publishedVersion
dc.identifier.doi10.1109/LATW.2017.7906758
dc.subject.keywordsPhase shifters
dc.subject.keywordsCharacteristic polynomials
dc.subject.keywordsDeterministic test pattern
dc.subject.keywordsLinear feedback shift registers
dc.subject.keywordsStructure-based
dc.subject.keywordsTest Pattern
dc.subject.keywordsTest sets
dc.subject.keywordsTwo-dimensional tests
dc.subject.keywordsShift registers
dc.rights.accessrightsinfo:eu-repo/semantics/restrictedAccess
dc.rights.ccAtribución-NoComercial 4.0 Internacional
dc.identifier.instnameUniversidad Tecnológica de Bolívar
dc.identifier.reponameRepositorio UTB
dc.relation.conferencedate13 March 2017 through 15 March 2017
dc.type.spaConferencia
dc.identifier.orcid57197327858
dc.identifier.orcid7004389110


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Universidad Tecnológica de Bolívar - 2017 Institución de Educación Superior sujeta a inspección y vigilancia por el Ministerio de Educación Nacional. Resolución No 961 del 26 de octubre de 1970 a través de la cual la Gobernación de Bolívar otorga la Personería Jurídica a la Universidad Tecnológica de Bolívar.