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dc.contributor.authorSánchez Barrera, Estiven
dc.date.accessioned2023-07-27T20:24:53Z
dc.date.available2023-07-27T20:24:53Z
dc.date.issued2023-06-15
dc.date.submitted2023-06-15
dc.identifier.citationEstiven Sánchez Barrera, "Speckle interferometry single-shot applications with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252402 (15 June 2023); doi: 10.1117/12.2662369spa
dc.identifier.issn0277-786X
dc.identifier.urihttps://hdl.handle.net/20.500.12585/12442
dc.description.abstractThe need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle.spa
dc.format.extent11 páginas
dc.format.mimetypeapplication/pdfspa
dc.language.isoengspa
dc.titleSpeckle interferometry single-shot applications with multiple carrier-fringe informationspa
dcterms.bibliographicCitationGoodman, J. W., [Speckle phenomena in optics: theory and applications ], SPIE (2007).spa
dcterms.bibliographicCitation(ed), P. K. R., “Digital speckle pattern interferometry and related techniques,” Measurement Science and Technology 12, 1606 (sep 2001).spa
dcterms.bibliographicCitationSchmit, J., Creath, K., and Kujawinska, M., “Spatial and temporal phase-measurement techniques: a comparison of major error sources in one dimension,” in [Interferometry: Techniques and Analysis ], Brown, G. M., Kwon, O. Y., Kujawinska, M., and Reid, G. T., eds., 1755, 202 – 211, International Society for Optics and Photonics, SPIE (1993).spa
dcterms.bibliographicCitationKujawinska, M. and Wojiak, J., “Spatial phase-shifting techniques of fringe pattern analysis in photome chanics,” in [Second International Conference on Photomechanics and Speckle Metrology], Chiang, F.-P. and Chiang, F.-P., eds., 1554, 503, International Society for Optics and Photonics, SPIE (1991).spa
dcterms.bibliographicCitationCreath, K. and Goldstein, G., “Dynamic quantitative phase imaging for biological objects using a pixelated phase mask,” Biomed. Opt. Express 3, 2866–2880 (Nov 2012).spa
dcterms.bibliographicCitationPedrini, G., Zou, Y.-L., and Tiziani, H. J., “Quantitative evaluation of digital shearing interferogram using the spatial carrier method,” Pure and Applied Optics: Journal of the European Optical Society Part A 5, 313 (may 1996).spa
dcterms.bibliographicCitationSantos, F., Vaz, M., and Monteiro, J., “A new set-up for pulsed digital shearography applied to defect detection in composite structures,” Optics and Lasers in Engineering 42(2), 131–140 (2004).spa
dcterms.bibliographicCitationBhaduri, B., Mohan, N. K., Kothiyal, M. P., and Sirohi, R., “Use of spatial phase shifting technique in digital speckle pattern interferometry (dspi) and digital shearography (ds),” Opt. Express 14, 11598–11607 (Nov 2006).spa
dcterms.bibliographicCitationBarrera, E. S., Fantin, A. V., Willemann, D. P., Benedet, M. E., and Albertazzi Gon¸calves Jr., A., “Multiple aperture one-shot shearography for simultaneous measurements in three shearing directions,” Optics and Lasers in Engineering 111, 86–92 (2018).spa
dcterms.bibliographicCitationTakeda, M., Ina, H., and Kobayashi, S., “Fourier-transform method of fringe-pattern analysis for computer based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (Jan 1982).spa
dcterms.bibliographicCitationChang, G.-W., Lin, Y.-H., and Yeh, Z.-M., “White light interferometric profile measurement system us ing spectral coherence,” in [Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI], Hartzell, A. L. and Ramesham, R., eds., 6463, 64630I, International Society for Optics and Photonics, SPIE (2007).spa
dcterms.bibliographicCitationBarrera, E. S. and Cuello, J. L. E., “Measuring material thickness changes through tri-aperture digital speckle pattern interferometry,” Optical Engineering 62(1), 014108 (2023).spa
datacite.rightshttp://purl.org/coar/access_right/c_14cbspa
oaire.versionhttp://purl.org/coar/version/c_970fb48d4fbd8a85spa
dc.type.driverinfo:eu-repo/semantics/lecturespa
dc.type.hasversioninfo:eu-repo/semantics/publishedVersionspa
dc.subject.keywordsDigital Speckle Pattern Interferometryspa
dc.subject.keywordsSpatial Phase Measurementspa
dc.subject.keywordsRobust Measurementspa
dc.subject.keywordsCarrier-fringesspa
dc.subject.keywordsSingle-shot applicationsspa
dc.rights.accessrightsinfo:eu-repo/semantics/closedAccessspa
dc.identifier.instnameUniversidad Tecnológica de Bolívarspa
dc.identifier.reponameRepositorio Universidad Tecnológica de Bolívarspa
dc.publisher.placeCartagena de Indiasspa
dc.type.spahttp://purl.org/coar/resource_type/c_8544spa
dc.audiencePúblico generalspa
oaire.resourcetypehttp://purl.org/coar/resource_type/c_c94fspa


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Universidad Tecnológica de Bolívar - 2017 Institución de Educación Superior sujeta a inspección y vigilancia por el Ministerio de Educación Nacional. Resolución No 961 del 26 de octubre de 1970 a través de la cual la Gobernación de Bolívar otorga la Personería Jurídica a la Universidad Tecnológica de Bolívar.