Listar por tema "Measurement accuracy"

Mostrando ítems 1-2 de 2

    • Pixel-wise rational model for a structured light system 

      Vargas, Raúl; Romero, Lenny A; Zhang, Song; Marrugo, Andrés G. (Cartagena de Indias, 2023-05-15)
      This Letter presents a novel structured light system model that effectively considers local lens distortion by pixel-wise rational functions. We leverage the stereo method for initial calibration and then estimate the ...

    • Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy 

      Altamar Mercado, Hernando; Patiño Vanegas, Alberto; Marrugo A.G. (OSA - The Optical Society, 2019)
      White light scanning interference (WLSI) microscopes provide an accurate surface topography of engineered surfaces. However, the measurement accuracy is substantially reduced in surfaces with low-reflectivity regions or ...

      Universidad Tecnológica de Bolívar - 2017 Institución de Educación Superior sujeta a inspección y vigilancia por el Ministerio de Educación Nacional. Resolución No 961 del 26 de octubre de 1970 a través de la cual la Gobernación de Bolívar otorga la Personería Jurídica a la Universidad Tecnológica de Bolívar.