LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation

2020-03-262020-03-262017LATS 2017 - 18th IEEE Latin-American Test Symposium9781538604151https://hdl.handle.net/20.500.12585/8936In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this paper, we present a method to design the LFSR/PS structure based on the particular test set that we are given. Comparative experimental results show that the methodology can attain 100% coverage which cannot be achieved with current approaches. © 2017 IEEE.Recurso electrónicoapplication/pdfenghttp://creativecommons.org/licenses/by-nc-nd/4.0/LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generationinfo:eu-repo/semantics/conferenceObject10.1109/LATW.2017.7906758Phase shiftersCharacteristic polynomialsDeterministic test patternLinear feedback shift registersStructure-basedTest PatternTest setsTwo-dimensional testsShift registersinfo:eu-repo/semantics/restrictedAccessAtribución-NoComercial 4.0 InternacionalUniversidad Tecnológica de BolívarRepositorio UTB571973278587004389110