2020-03-262020-03-262018Optics InfoBase Conference Papers; Vol. Part F95-3D 20189781557528209https://hdl.handle.net/20.500.12585/8903In this work we study the use of a focus measure to improve the 3D reconstruction of low reflectivity microscopic samples using white light interference microscopy. Simulation and experimental results show the improved reconstruction. © 2018 The Author(s).Recurso electrónicoapplication/pdfenghttp://creativecommons.org/licenses/by-nc-nd/4.0/Microscopic shape from focus using white light interferometric fringesinfo:eu-repo/semantics/conferenceObject10.1364/3D.2018.JTu4A.19Image acquisition3D reconstructionFocus measureInterferometric fringesShape from focusWhite lightWhite light interference microscopyThree dimensional displaysinfo:eu-repo/semantics/restrictedAccessAtribución-NoComercial 4.0 InternacionalUniversidad Tecnológica de BolívarRepositorio UTB572033219955719068845924329839300